About this scholarly article

SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - In situ real-time x-ray quality assessment of BGA and uBGA connections during soldering by Scholz, Oliver; Meyendorf, Norbert; Baaklini, George Y.; Eisenbarth, Michael; Hanke, Randolf; Michel, Bernd; Bigl, Thomas; Schmitt, Peter is a scholarly article available to read on EtoBox.

Author

Scholz, Oliver; Meyendorf, Norbert; Baaklini, George Y.; Eisenbarth, Michael; Hanke, Randolf; Michel, Bernd; Bigl, Thomas; Schmitt, Peter

Publisher

SPIE

Published

2003