About this Engineering article
Key Factors to Enhance the Switching Characteristics in Submicron MRAM Cells by Kim, H.-J.; Lee, J.E.; Baek, I.G.; Ha, Y.K.; Bae, J.S.; Oh, S.C.; Park, S.O.; Chung, U.-I.; Lee, N.I.; Kang, H.K.; Moon, J.T. is a Engineering article available to read on EtoBox.
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- Author
- Kim, H.-J.; Lee, J.E.; Baek, I.G.; Ha, Y.K.; Bae, J.S.; Oh, S.C.; Park, S.O.; Chung, U.-I.; Lee, N.I.; Kang, H.K.; Moon, J.T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9464)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)