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About this Materials Science article

Imaging of Materials through Aberration Corrected STEM by Lupini, A R; Veith, G M; Dudney, N J; Chisholm, M F; Benthem, K van; Varela, M; Borisevich, A Y; Peng, Y; Rashkeev, S; Pennycook, S J is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Lupini, A R; Veith, G M; Dudney, N J; Chisholm, M F; Benthem, K van; Varela, M; Borisevich, A Y; Peng, Y; Rashkeev, S; Pennycook, S J
Publisher
Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
Published
2005
Language
EN
Field
Materials Science (Physical Sciences)

More by Lupini, A R; Veith, G M; Dudney, N J; Chisholm, M F; Benthem, K van; Varela, M; Borisevich, A Y; Peng, Y; Rashkeev, S; Pennycook, S J

Browse all works by Lupini, A R; Veith, G M; Dudney, N J; Chisholm, M F; Benthem, K van; Varela, M; Borisevich, A Y; Peng, Y; Rashkeev, S; Pennycook, S J