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Fuse Area Reduction for Memory Yield Optimization by raf is a document available to read on EtoBox.

What is Fuse Area Reduction for Memory Yield Optimization about?

The document discusses reducing the number of fuses used for memory repair in integrated circuits to lower costs. It presents a methodology to determine an optimal fuse compression ratio by considering factors like memory yield, fuse yield, repair logic yield, and the number of memories on the chip. The goal is to compress the total number of fuses for repair while maximizing cost reduction from the hard repair circuitry.

Author

raf

Language

EN