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About this Engineering article
Wafer Probe Mark Area Estimation via Digital Image Processing Approach by Wang, Chau-Shing; Chang, Wen-Liang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wang, Chau-Shing; Chang, Wen-Liang
- Publisher
- Chinese Electronic Periodical Services; Informa UK (Taylor & Francis); Chinese Institute of Industrial Engineers; Informa UK Limited (ISSN 1017-0669)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)