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ESD Reliability in Thin Film Transistors by deborah eric is a document available to read on EtoBox.
What is ESD Reliability in Thin Film Transistors about?
This document provides an overview of the reliability issues of thin film transistors (TFTs) under electrostatic discharge (ESD) stresses, highlighting their vulnerability compared to CMOS technology. It discusses the characterization of TFTs under ESD stress, failure mechanisms, and optimization methods to enhance ESD robustness. The review emphasizes the need for effective ESD protection measures in the design and manufacturing of electronic components as device dimensions shrink in modern technologies.
- Author
- deborah eric
- Language
- EN