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Can I read Design, Analysis And Test Of Logic Circuits Under Uncertainty (lecture Notes In Electrical Engineering) on EtoBox?
Design, Analysis And Test Of Logic Circuits Under Uncertainty (lecture Notes In Electrical Engineering) by Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.) is a nonfiction available to read on EtoBox.
What is Design, Analysis And Test Of Logic Circuits Under Uncertainty (lecture Notes In Electrical Engineering) about?
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. Erscheinungsdatum: 21.09.2012
Who reads Design, Analysis And Test Of Logic Circuits Under Uncertainty (lecture Notes In Electrical Engineering)?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.)
- Publisher
- Springer Netherlands; Imprint: Springer
- Published
- 2013
- Language
- EN
- ISBN
- 9789048196432
- Category
- nonfiction
- Subjects
- Computer Science, Mathematics, Engineering
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