About this scholarly article

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - On using IEEE P1500 SECT for test plug-n-play by Marinissen, E.J.; Kapur, R.; Zorian, Y. is a scholarly article available to read on EtoBox.

Author

Marinissen, E.J.; Kapur, R.; Zorian, Y.

Publisher

Int. Test Conference

Published

2000

Language

EN