About this scholarly article

1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No 98CH36173) RELPHY-98 - Dynamics of backside wafer level microprobing by Chiang, C.-L.; Hurley, D.T. is a scholarly article available to read on EtoBox.

Author

Chiang, C.-L.; Hurley, D.T.

Publisher

IEEE

Published

1998