About this scholarly article

2009 IEEE International Reliability Physics Symposium - Threshold voltage instability in organic TFT with SiO2 and SiO2/parylene-stack dielectrics by Wrachien, Nicola; Cester, Andrea; Pinato, Alessandro; Meneghini, Matteo; Tazzoli, Augusto; Meneghesso, Gaudenzio; Kovac, Jaroslav; Jakabovic, Jan; Donoval, Daniel is a scholarly article available to read on EtoBox.

Author

Wrachien, Nicola; Cester, Andrea; Pinato, Alessandro; Meneghini, Matteo; Tazzoli, Augusto; Meneghesso, Gaudenzio; Kovac, Jaroslav; Jakabovic, Jan; Donoval, Daniel

Publisher

IEEE

Published

2009