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About this Materials Science article
Helium Ion Microscopy with Secondary Ion Mass Spectrometry for Nanoscale Chemical Imaging and Analysis of Polyolefins by Ovchinnikova, Olga S. (author);Borodinov, Nikolay (author);Trofimov, Artem A. (author);King, Steven T. (author);Lorenz, Matthias (author);Lamberti, William (author);Abmayr, David (author);Ievlev, Anton V. (author) is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Ovchinnikova, Olga S. (author);Borodinov, Nikolay (author);Trofimov, Artem A. (author);King, Steven T. (author);Lorenz, Matthias (author);Lamberti, William (author);Abmayr, David (author);Ievlev, Anton V. (author)
- Publisher
- American Chemical Society (ACS)
- Published
- 2021
- Field
- Materials Science (Physical Sciences)