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About this Materials Science article
Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source by K. Aimoto; S. Aoyagi; N. Kato; N. Iida; A. Yamamoto; M. Kudo is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- K. Aimoto; S. Aoyagi; N. Kato; N. Iida; A. Yamamoto; M. Kudo
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 2006
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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