About this scholarly article

Highly scalable Z-RAM with remarkably long data retention for DRAM application by Jang, Tae-Su (author);Kim, Joong-Sik (author);Hwang, Sang-Min (author);Oh, Young-Hoon (author);Rho, Kwang-Myung (author);Chung, Seoung-Ju (author);Chung, Su-Ock (author);Oh, Jae-Geun (author);Bhardwaj, Sunil (author);Kwon, Jungtae (author);Kim, David (author);Nagoga, Mikhail (author);Kim, Yong-Taik (author) is a scholarly article available to read on EtoBox.

Author

Jang, Tae-Su (author);Kim, Joong-Sik (author);Hwang, Sang-Min (author);Oh, Young-Hoon (author);Rho, Kwang-Myung (author);Chung, Seoung-Ju (author);Chung, Su-Ock (author);Oh, Jae-Geun (author);Bhardwaj, Sunil (author);Kwon, Jungtae (author);Kim, David (author);Nagoga, Mikhail (author);Kim, Yong-Taik (author)

Published

2009