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About this Engineering article
Emission of an Edge Dislocation from a Thin-Film-Covered Crack by Qian, C.-F.; Zhang, Tong Yi; Tong, Pin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Qian, C.-F.; Zhang, Tong Yi; Tong, Pin
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9795)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)