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What is FMEA and KT Method in Fab Management about?

This document describes a new methodology that integrates Failure Mode and Effects Analysis (FMEA) and Kepner-Tregoe (KT) methods to help engineers efficiently handle urgent issues in semiconductor fab daily management. The methodology follows the steps of a quality control story. Potential causes of failures are identified from an existing FMEA database. KT

Author

adriansinisa

Language

EN