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About this Engineering article
Interface Optimization of Passivated Er2O3/Al2O3/InP MOS Capacitors and Modulation of Leakage Current Conduction Mechanism by Qiao, Lesheng (author);He, Gang (author);Hao, Lin (author);Lu, Jinyu (author);Gao, Qian (author);Zhang, Miao (author);Fang, Zebo (author) is a Engineering article available to read on EtoBox.
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- Author
- Qiao, Lesheng (author);He, Gang (author);Hao, Lin (author);Lu, Jinyu (author);Gao, Qian (author);Zhang, Miao (author);Fang, Zebo (author)
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Published
- 2021
- Field
- Engineering (Physical Sciences)