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About this Engineering article
Structural Characterization of Ultra-thin (0 0 1) Silicon Films Bonded Onto (0 0 1) Silicon Wafers:: a Transmission Electron Microscopy Study by K. Rousseau; J.L. Rouvière; F. Fournel; H. Moriceau is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- K. Rousseau; J.L. Rouvière; F. Fournel; H. Moriceau
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 1369-8001)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)
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