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About this Engineering article
Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filters by Birdsall, S.A.; Dever, P.B.; Donovan, J.B.; Driscoll, M.M.; Lakin, K.M.; Pham, T.H. is a Engineering article available to read on EtoBox.
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- Author
- Birdsall, S.A.; Dever, P.B.; Donovan, J.B.; Driscoll, M.M.; Lakin, K.M.; Pham, T.H.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0885-3010)
- Published
- 2002
- Language
- EN
- Field
- Engineering (Physical Sciences)