About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Advances in X-Ray Optics - Global optimization and reflectivity data fitting for x-ray multilayer mirrors by means of genetic algorithms by Sanchez del Rio, Manuel; Pareschi, Giovanni; Freund, Andreas K.; Ishikawa, Tetsuya; Khounsary, Ali M.; Mancini, Derrick C.; Michette, Alan G.; Oestreich, Sebastian is a scholarly article available to read on EtoBox.

Author

Sanchez del Rio, Manuel; Pareschi, Giovanni; Freund, Andreas K.; Ishikawa, Tetsuya; Khounsary, Ali M.; Mancini, Derrick C.; Michette, Alan G.; Oestreich, Sebastian

Publisher

SPIE

Published

2001