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About this Engineering article

Typical applications of ion implanted layer as a diffusion source for MOS and bipolar devices: Janusz Krylow, Aleksander Bakowski and Krzysztofsaczuk Electron Technology 12 (4), 3 (1979) is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Publisher
Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0026-2692)
Published
1984
Language
EN
Field
Engineering (Physical Sciences)