About this Engineering article
Numerical Simulation of Tunnel Effect Transistors Employing Internal Field Emission of Schottky Barrier Junction by Hattori, Reiji; Shirafuji, Junji is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hattori, Reiji; Shirafuji, Junji
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 1994
- Field
- Engineering (Physical Sciences)