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About this scholarly article
Testability of Micromachined Silicon Rate Sensors by Jaffe, R.; Heiertz, J.; Ventresco, S.; Jaffe, R.; Heiertz, J.; Ventresco, S. is a scholarly article available to read on EtoBox.
- Author
- Jaffe, R.; Heiertz, J.; Ventresco, S.; Jaffe, R.; Heiertz, J.; Ventresco, S.
- Publisher
- American Institute of Aeronautics and Astronautics
- Published
- 1997
- Language
- EN
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