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About this Engineering article
BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel by Young-Chan Jang; Hoeju Chung; Youngdon Choi; Hwanwook Park; Jaekwan Kim; Soouk Lim; Jung Sunwoo; Moon-Sook Park; Hyung-Seuk Kim; Sang-Yun Kim; Yun-Sang Lee; Woo-Seop Kim; Jung-Bae Lee; Jeihwan Yoo; Changhyun Kim is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Young-Chan Jang; Hoeju Chung; Youngdon Choi; Hwanwook Park; Jaekwan Kim; Soouk Lim; Jung Sunwoo; Moon-Sook Park; Hyung-Seuk Kim; Sang-Yun Kim; Yun-Sang Lee; Woo-Seop Kim; Jung-Bae Lee; Jeihwan Yoo; Changhyun Kim
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9200)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)