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X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions by Claudio Ferrari; Fabrizio Germini; Dusan Korytár; Petr Mikulík; Luca Peverini is a Materials Science article available to read on EtoBox.

What is X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions about?

The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection. The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than 0.6°. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3° due to etching to remove the cutting damage and the increasing effect of refraction at glancing angles close to the critical angle. These findings confirm that highly asymmetric channel-cut Ge crystals can also work as efficient monochromators or image magnifiers at glancing angles close to the critical angl

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Author

Claudio Ferrari; Fabrizio Germini; Dusan Korytár; Petr Mikulík; Luca Peverini

Publisher

International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)

Published

2011

Language

EN

Field

Materials Science (Physical Sciences)