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A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance by Hachem, D.; Trémouilles, D.; Morancho, F.; Toulon, G. is a Engineering article available to read on EtoBox.

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Author
Hachem, D.; Trémouilles, D.; Morancho, F.; Toulon, G.
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
Published
2018
Field
Engineering (Physical Sciences)

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