About this scholarly article

SAE Technical Paper Series [SAE International SAE 2004 World Congress & Exhibition - (MAR. 08, 2004)] SAE Technical Paper Series - Analytical Metamodel-Based Global Sensitivity Analysis and Uncertainty Propagation for Robust Design by Jin, Ruichen; Chen, Wei; Sudjianto, Agus is a scholarly article available to read on EtoBox.

Author

Jin, Ruichen; Chen, Wei; Sudjianto, Agus

Publisher

SAE International

Published

2004

Language

EN