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Analysis of Nano-Structured ${\rm In} {2}{\rm O} {3}$ Thin Film ${\rm NO} {\rm x}$ Sensor by AC Impedance Spectroscopy by Mariappan, Chinnasamy Ramaraj; Prabhu, Ethirajulu; Gnanasekar, Kovilpillai Immanuel; Jayaraman, Venkataraman; Gnanasekaran, Thiagarajan is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Mariappan, Chinnasamy Ramaraj; Prabhu, Ethirajulu; Gnanasekar, Kovilpillai Immanuel; Jayaraman, Venkataraman; Gnanasekaran, Thiagarajan
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1530-437X)
Published
2014
Language
EN
Field
Engineering (Physical Sciences)

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