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About this Engineering article
Wireless Pad-free Integrated Circuit Debugging by Powering Modulation and Lock-in Infrared Sensing by León, J.; Perpiñà, X.; Vellvehi, M.; Baldi, A.; Sacristán, J.; Jordà, X is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- León, J.; Perpiñà, X.; Vellvehi, M.; Baldi, A.; Sacristán, J.; Jordà, X
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)
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