Opening book details…
About this scholarly article
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Large-scale broadband parasitic extraction for fast layout verification of 3D RF and mixed-signal on-chip structures by Feng Ling, ; Okhmatovski, V.; Harris, W.; McCracken, S.; Aykut Dengi, is a scholarly article available to read on EtoBox.
- Author
- Feng Ling, ; Okhmatovski, V.; Harris, W.; McCracken, S.; Aykut Dengi,
- Publisher
- IEEE
- Published
- 2004
- Language
- EN
More by Feng Ling, ; Okhmatovski, V.; Harris, W.; McCracken, S.; Aykut Dengi,
Browse all works by Feng Ling, ; Okhmatovski, V.; Harris, W.; McCracken, S.; Aykut Dengi,