About this scholarly article

SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Measurement of the roughness surface using the normalized autocorrelation function of the fields of the texture of speckle pattern by Pino, Abdiel O.; Pladellorens, Josep; Doval, Ángel F.; Trillo, Cristina is a scholarly article available to read on EtoBox.

Author

Pino, Abdiel O.; Pladellorens, Josep; Doval, Ángel F.; Trillo, Cristina

Publisher

SPIE

Published

2012

Language

EN