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About this Engineering article
Device performance and bias instability of Ta doped InZnO thin film transistor as a function of process pressure by Park, Hyun-Woo; Kim, Boo-Kyoung; Park, Jin-Seong; Chung, Kwun-Bum is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Park, Hyun-Woo; Kim, Boo-Kyoung; Park, Jin-Seong; Chung, Kwun-Bum
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2013
- Field
- Engineering (Physical Sciences)