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About this scholarly article
IEEE International Integrated Reliability Workshop Final Report, 2002. - Comparison of low leakage and high speed deep submicron PMOSFETs submitted to hole injections by Bravaix, A.; Goguenheim, D.; Revil, N.; Vincent, E. is a scholarly article available to read on EtoBox.
- Author
- Bravaix, A.; Goguenheim, D.; Revil, N.; Vincent, E.
- Publisher
- IEEE
- Published
- 2002
- Language
- EN
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