About this scholarly article

SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing - Research and application of ergonomics to optical microscope by Jiang, Xue-kun; Xiao, Ze-xin; Zhang, Jie; Zhou, Liwei is a scholarly article available to read on EtoBox.

Author

Jiang, Xue-kun; Xiao, Ze-xin; Zhang, Jie; Zhou, Liwei

Publisher

SPIE

Published

2007

Language

EN