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About this Engineering article
Dependence of the Residual Strain in GaN on the AlN Buffer Layer Annealing Parameters by Le Vaillant, Y.-M.; Ciur, S.; Andenet, A.; Briot, O.; Gil, B.; Aulombard, R. L.; Bisaro, R.; Olivier, J.; Durand, O.; Duboz, J.-Y. is a Engineering article available to read on EtoBox.
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- Author
- Le Vaillant, Y.-M.; Ciur, S.; Andenet, A.; Briot, O.; Gil, B.; Aulombard, R. L.; Bisaro, R.; Olivier, J.; Durand, O.; Duboz, J.-Y.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)