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About this Materials Science article
Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy by Terauchi, M.; Koike, M.; Fukushima, K.; Kimura, A. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Terauchi, M.; Koike, M.; Fukushima, K.; Kimura, A.
- Publisher
- Oxford University Press; Oxford University Press (OUP) (ISSN 0022-0744)
- Published
- 2010
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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