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About this Engineering article
Parasitic Current Induced by Gate Overlap in Thin-Film Transistors by Lee, Hyeon-Jun (author);Abe, Katsumi (author);Kim, June-Seo (author);Yun, Won Seok (author);Lee, Myoung-Jae (author) is a Engineering article available to read on EtoBox.
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- Author
- Lee, Hyeon-Jun (author);Abe, Katsumi (author);Kim, June-Seo (author);Yun, Won Seok (author);Lee, Myoung-Jae (author)
- Publisher
- MDPI AG
- Published
- 2021
- Field
- Engineering (Physical Sciences)