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What is Lecture 3 SEM and TEM about?

Scanning Electron Microscopy (SEM) is a technique that uses electrons instead of light to create high-resolution images of sample surfaces, offering advantages such as greater depth of field and magnification compared to Optical Microscopy (OM). The document outlines the working principles of SEM, its major components, and various electron beam interactions, along with applications in topography, morphology, composition, and crystallography. Additionally, it discusses the importance of vacuum conditions and

Author

Prayaag Patel

Language

EN