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Can I read Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article) on EtoBox?
Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article) by Kazushige Horio is a Engineering article available to read on EtoBox.
What is Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article) about?
## Abstract Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semi‐insulating (SI) substrate. For a higher acceptor density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes smaller. Effects of introducing a p‐buffer layer are also studied in terms of dependencies on p‐layer thickness and its doping density. © 1993 John Wiley & Sons, Inc.
Who reads Two-dimensional analysis of cutoff frequencies of GaAs MESFETS with various substrate conditions (invited article)?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kazushige Horio
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 1050-1827)
- Published
- 1993
- Language
- EN
- Field
- Engineering (Physical Sciences)