About this scholarly article

Proceedings of 8th International Conference on Indium Phosphide and Related Materials - Use of reflectance spectroscopy for in-situ monitoring of InP/InGaAsP films grown by MOVPE by Lum, R.M.; McDonald, M.L.; Bean, J.C.; Vandenberg, J.; Pernell, T.L.; Chu, S.N.G.; Robertson, A.; Karp, A. is a scholarly article available to read on EtoBox.

Author

Lum, R.M.; McDonald, M.L.; Bean, J.C.; Vandenberg, J.; Pernell, T.L.; Chu, S.N.G.; Robertson, A.; Karp, A.

Publisher

IEEE

Published

1996