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About this Engineering article
Strain rate sensitivity and Hall–Petch behavior of ultrafine-grained gold wires by Y.H. Chew; C.C. Wong; F. Wulff; F.C. Lim; H.M. Goh is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Y.H. Chew; C.C. Wong; F. Wulff; F.C. Lim; H.M. Goh
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2008
- Field
- Engineering (Physical Sciences)
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