About this scholarly article

1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - MOS imaging with random noise suppression by Ohba, S.; Nakai, M.; Ando, H.; Ozaki, T.; Ozawa, N.; Imaide, T.; Ikeda, K.; Suzuki, T.; Takemoto, I.; Masuhara, T. is a scholarly article available to read on EtoBox.

Author

Ohba, S.; Nakai, M.; Ando, H.; Ozaki, T.; Ozawa, N.; Imaide, T.; Ikeda, K.; Suzuki, T.; Takemoto, I.; Masuhara, T.

Publisher

IEEE

Published

1984