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Can I read Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-effect Transistors on EtoBox?
Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-effect Transistors by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim is a engineering available to read on EtoBox.
What is Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-effect Transistors about?
Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlik
Who reads Photo-Excited Charge Collection Spectroscopy : Probing the Traps in Field-effect Transistors?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim
- Publisher
- Springer Netherlands
- Published
- 2013
- Language
- EN
- ISBN
- 9789400763920
- Category
- engineering
- Subjects
- Science, Engineering, Physics
- Updated
- 2026-03-25
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