Opening book details…
About this Engineering article
Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In–Ga–Zn–O Thin-Film Transistors by Chen, Wei-Tsung; Lo, Shih-Yi; Kao, Shih-Chin; Zan, Hsiao-Wen; Tsai, Chuang-Chuang; Lin, Jian-Hong; Fang, Chun-Hsiang; Lee, Chung-Chun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chen, Wei-Tsung; Lo, Shih-Yi; Kao, Shih-Chin; Zan, Hsiao-Wen; Tsai, Chuang-Chuang; Lin, Jian-Hong; Fang, Chun-Hsiang; Lee, Chung-Chun
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 2011
- Field
- Engineering (Physical Sciences)