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About this Physics and Astronomy article
AIP Conference Proceedings - Thickness Evaluation for 2nm SiO2 Films, a Comparison of Ellipsometric, Capacitance-Voltage and HRTEM Measurements by Ehrstein, James is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Ehrstein, James
- Publisher
- AIP
- Published
- 2003
- Field
- Physics and Astronomy (Physical Sciences)