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Surface characterization of 7S and 11S globulin powders from soy protein examined by X-ray photoelectron spectroscopy and scanning electron microscopy by Xiaoyan Zhao; Jun Chen; Qingjun Zhu; Fangling Du; Qiang Ao; Jie Liu is a Materials Science article available to read on EtoBox.
What is Surface characterization of 7S and 11S globulin powders from soy protein examined by X-ray photoelectron spectroscopy and scanning electron microscopy about?
In this study the surface composition of 7S and 11S globulin powders from soybean proteins by aqueous buffer and reverse micelle extractions had been examined using X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). Analysis by XPS revealed that the O and N atomic percentage of 7S and 11S globulin surfaces from bis(2-ethylhexyl) sodium sulfosuccinate (AOT) reverse micelle was higher than from aqueous buffer, but the C atomic percentage was lower. The O/C ratio of the 7S globulin powder from aqueous buffer and reverse micelle was similar while significant differences were obtained in the O/C ratio of the 11S globulin powder, N/C atom ratios of the 7S and 11S globulin powders and high-resolution XPS C 1s, N 1s, O 1s spectra. Powder microstructure after reverse micelle treatment showed the presence of small pores, indicating the effect of reverse micelle on the 7S and 11S globulin structure. The obtained results indicated that the reverse micelle could affect the C, O and N components on the surface of soybean proteins.
Who reads Surface characterization of 7S and 11S globulin powders from soy protein examined by X-ray photoelectron spectroscopy and scanning electron microscopy?
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Xiaoyan Zhao; Jun Chen; Qingjun Zhu; Fangling Du; Qiang Ao; Jie Liu
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-7765)
- Published
- 2011
- Language
- EN
- Field
- Materials Science (Physical Sciences)