About this scholarly article

1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Characterization of contact and via failure under short duration high pulsed current stress by Banerjee, K.; Amerasekera, A.; Dixit, G.; Cheung, N.; Chenming Hu, is a scholarly article available to read on EtoBox.

Author

Banerjee, K.; Amerasekera, A.; Dixit, G.; Cheung, N.; Chenming Hu,

Publisher

IEEE

Published

1997