Opening book details…
About this scholarly article
2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Physical analysis of the high-temperature subthreshold slope in SOI MOSFETs by Rudenko, T.; Kilchytska, V.; Colinge, J.-P.; Flandre, D. is a scholarly article available to read on EtoBox.
- Author
- Rudenko, T.; Kilchytska, V.; Colinge, J.-P.; Flandre, D.
- Publisher
- IEEE
- Published
- 2000
More by Rudenko, T.; Kilchytska, V.; Colinge, J.-P.; Flandre, D.
Browse all works by Rudenko, T.; Kilchytska, V.; Colinge, J.-P.; Flandre, D.