About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Spectrally resolved measurement of small optical losses by cavity enhanced spectroscopy techniques by Zeuner, T.; Lehmann, Peter H.; Osten, Wolfgang; Paa, W.; Schmidl, G.; Gastinger, Kay; Mühlig, Ch. is a scholarly article available to read on EtoBox.

Author

Zeuner, T.; Lehmann, Peter H.; Osten, Wolfgang; Paa, W.; Schmidl, G.; Gastinger, Kay; Mühlig, Ch.

Publisher

SPIE

Published

2011