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About this book
Gate-bias instability of few-layer WSe2 field effect transistors by Shaofeng Wen & Changyong Lan & Chun Li & Sihan Zhou & Tianying He & Rui Zhang & Ruisen Zou & Hao Hu & Yi Yin & Yong Liu is a book available to read on EtoBox.
- Author
- Shaofeng Wen & Changyong Lan & Chun Li & Sihan Zhou & Tianying He & Rui Zhang & Ruisen Zou & Hao Hu & Yi Yin & Yong Liu
- Publisher
- Royal Society of Chemistry
- Language
- EN
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