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About this Materials Science article
Structural, electrical and optical characterization of Ti-doped ZnO films grown by atomic layer deposition by Bergum, Kristin; Hansen, Per-Anders; Fjellvåg, Helmer; Nilsen, Ola is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Bergum, Kristin; Hansen, Per-Anders; Fjellvåg, Helmer; Nilsen, Ola
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0925-8388)
- Published
- 2014
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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